HOME/Tech Tree/Product
PH-E-041

XRD (X-ray diffraction)

Photonic장비구조분석
PRODUCT

Technical Description

Analyzes crystal structure, lattice constants, and thin-film quality

Specifications

Resolution <1 nm, magnification 10–500,000×, EDS analysis available

Opinions on This Product

Opinions are collected on the Korean page.

Go to the Korean page
Interested in technology cooperation for this product?

Register your available or needed technologies and the Council matching committee will review them for cooperation matching.

Submit a Cooperation Proposal →